| Title | Keywords | Author(s) | Validation Results | Technology |
|---|---|---|---|---|
| Fabrication Integration and ScaleUp | Photoelectrochemical Cell (PEC) | Nemanja Danilovic, Tobias Kistler, David Larson | Photoelectrochemical (PEC) | |
| Flat Band Potentials | Flat Band Potential, Photoelectrode, Illuminated Open Circuit Potential, Mott-Schottky 'M-S' Analysis, Photocurrent Onset, Electrochemical Impedance Spectroscopy | Todd Deutsch, Burton Simpson, James Young | Photoelectrochemical (PEC) | |
| GDL Compressibility | Gas Diffusion Layer (GDL), Compressibility, Electrolyzer | Jason Morgan, Hui Xu | Low Temperature Electrolysis (LTE) | |
| H2 Production Rate and Electronic Leakage | Hanping Ding, Dong Ding | High Temperature Electrolysis (HTE) | ||
| IEC AEM SOP | Ion Exchange Capacity (IEC), Anion Exchange Membrane (AEM) | Yushan Yan, Santiago Rojas-Carbonell, Brian Setzler, Matthew Ueckermann, Kelly M. Meek | Low Temperature Electrolysis (LTE) | |
| IEC PEM SOP | Electrolyzer, Proton Exchange Membrane (PEM), Ion Exchange Capacity (IEC) | Kelly M. Meek | Low Temperature Electrolysis (LTE) | |
| Impedance Spectroscopy Test | Solid Oxide Cell, Ohmic Resistance, Polarization Resistance | High Temperature Electrolysis (HTE) | ||
| Interconnect Resistance Measurements | Ani Kulkarni, Saheli Biswas | High Temperature Electrolysis (HTE) | ||
| Large Area Cell Testing | Scott Swartz | High Temperature Electrolysis (HTE) | ||
| Leak test for SOECs | Solid Oxide Cell, Sealing, Leak Test | Yeong-Shyung Chou, John Hardy, Olga A. Marina | High Temperature Electrolysis (HTE) |
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